Program Committee Members
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Aftelak, Andrew, Motorola Inc, US *Anastassova, Margarita, CEA, LIST FR Andersen, Kristina, -, DE Antona, Margherita, FORTH-ICS, GR *Ashbrook, Daniel, Georgia Tech, US Ballagas, Rafael, Nokia, US *Baudisch, Patrick, Hasso Plattner Institute AND Microsoft Research, DE Bernhaupt, Regina, IRIT / University of Toulouse FR Betz, Matthias, Fraunhofer FIT, DE *Borchers, Jan, RWTH Aachen University, DE Breunig, Martin, University of Osnabrueck, DE Broekens, Joost, Delft University of Technology NL Broll, Gregor, DOCOMO Euro-Labs, DE Brown, Barry, University of California San Diego US Cheok, Adrian David, Keio-NUS CUTE Center SG *Cheverst, Keith, University of Lancaster, UK Chittaro, Luca, University of Udine, IT Clawson, James, Georgia Institute of Technology US Coiana, Marcello, -, IT Conconi, Alex, -, IT Coulton, Paul, Infolab21 Lancaster University UK Dachselt, Raimund, University of Magdeburg, DE De Luca, Alexander, University of Munich DE de Poot, Henk, Telematica Instituut, NL Deledda, Dario, -, IT Denef, Sebastian, Fraunhofer FIT, DE Dey, Anid, Carnegie Mellon University, US Diehl, Jonathan, RWTH Aachen University, DE Dunlop, Mark, University of Strathclyde, UK *Eisenhauer, Markus, Fraunhofer FIT, DE Englert, Roman, T-Labs + Ben Gurion University Beer-Sheva IL Erickson, Ingrid, Stanford University, US Eslambolchilar, Parisa, Swansea University UK Fernaeus, Ylva, Swedish Institute of Computer Science SE Fleischmann, Monika, -, DE Geven, Arjan, CURE - Center for Usability Research and Engineering, AT Gomez, Gloria, Swinburne University of Technology AU Gonzalez, Gustavo, Imagina-Mediapro Research, ES Gorsev, Pinar Kaprali, Phonoclick, TR Grey, Philip, -, UK Gross, Tom, Bauhaus-University Weimar, DE *Guinard, Dominique, Auto-ID Labs, ETH Zurich CH Hakkila, Jonna, Nokia, FI Hakulinen, Jaakko, University of Tampere FI Hara, Takahiro, Osaka University, JP Harper, Richard, Microsoft Research Cambridge UK Hart de Ruijter, Evelijne, Philips Research, NL Heller, Florian, RWTH Aachen University, DE *Henke, Katja, T-Labs Berlin, DE Henseler, Wolfgang, -, DE Herkenrath, Gero, RWTH Aachen University, DE *Herzog, Otthein, University of Bremen, DE *Hess, Jan, University of Siegen, DE Holleis, Paul, DOCOMO Euro Labs, DE Holmquist, Lars, SICS, SE Hornecker, Eva, University of Strathclyde UK *Jacucci, Giulio, Helsinki Institute for Information Technology, FI Jain, Jhilmil, Hewlett-Packard Laboratories US *Jarke, Matthias, RWTH Aachen University, DE Jeon, Myoung Hoon, Georgia Tech, US Johri, Aditya, Virginia Tech, US Jones, Matt, Swansea University, UK *Juhlin, Oskar, Interactive Institute Stockholm S Kaikkonen, Anne, Nokia, FI Karrer, Thorsten, RWTH Aachen University, DE Kayserilioglu, Ufuk, -, TR Klann, Markus, Fraunhofer FIT, DE Koleva, Boriana, University of Nottingham, UK Korhonen, Hannu, Nokia Research, FI Kort, Joke, TNO Information and Communication Technology, NL Krajewski, Andrea, University of Applied Sciences Darmstadt, DE *Kray, Chris, Newcastle University, UK *Krüger, Antonio, University of Münster, DE Kurdyukova, Ekaterina, Augsburg University DE Kuutti, Kari, University of Oulu, FI Kyng, Morton, Aarhus University, DK *Laerhoven, Kristof van, TU Darmstadt DE Langheinrich, Marc, University of Lugano (USI) CH Lee, John S., Research In Motion, CA *Lee, Ju Hwan, University of Oxford, UK Lee, Young, Motorola Applied Research and Technology Center, US Leuchter, Sandro, Fraunhofer Institute for Information and Data Processing (IITB), DE Leung, Rock, University of British Columbia CA *Li, Kevin, University of California, San Diego US Liarokapis, Fotis, Coventry University UK Lichtschlag, Leonhard, RWTH Aachen University DE Liu, Ying, Nokia Research Center, Beijing, CN Loregian, Marco, University of Milano-Bicocca IT *Lorenz, Andreas, Fraunhofer FIT, DE Lueg, Christopher, University of Tasmania AU Lui, Alfred, Motorola, US Lumsden, Joanna, National Research Council of Canada CA Luo, Lu, Nokia Research Center, Palo Alto US Lyons, Kent, Intel Research, US Magerkurth, Carsten, SAP-Research St. Gallen, CH Marsden, Gary, University of Cape Town, ZA Masoodian, Masood, University of Waikato NZ Mayrhofer, Rene, Universität Wien, AT Menezes, Nilo, Multitel ASBL, BE Merrill, David, MIT Media Lab, US *Michahelles, Florian, ETH Zürich, CH Michelis, Giorgio de, University of Milano – Bicocca IT Mihalic, Kris, Yahoo! Inc., US Montgomery Masters, Michelle, University of Strathclyde UK *Morley, Stefan, Drägerwerk AG & Co KGaA, DE Mueller, Florian Floyd, The University of Melbourne, AU *Mulder, Ingrid, Delft University of Technology NL *Müller, Jörg, University of Münster, DE Möllers, Max, RWTH Aachen University, DE Nigay, Laurence, University of Grenoble 1, FR *Niman, Bruno von, vonniman consulting and ETSI Human Factors, S *Nurmi, Petteri, Helsinki Institute for Information Technology FI Oberquelle, Horst, University of Hamburg DE Obrist, Marianna, HCI & Usability Unit, ICT&S Center, University of Salzburg, AT *Oliveira, Jonice, UERJ, BR Oliver, Nuria, Telefonica R&D / Microsoft Research ES Omojokun, Olufisayo, Georgia Institute of Technology, US Palanque, Philippe, Université Paul Sabatier - Toulouse 3 FR Partala, Timo, Tampere University of Technology FI Paternó, Fabio, CNR-ISTI Pisa, IT Peinado, Antonio M., Universidad de Granada ES Pekkola, Samuli, Tampere University of Technology FI Pering, Trevor, Intel Research, US *Pipek, Volkmar, University of Siegen, DE Preuveneers, Davy, Katholieke Universiteit Leuven BE Pribeanu, Costin, ICI Bucuresti, RO Rajanen, Mikko, University of Oulu, FI Rajput, Nitendra, IBM Research, IN Ramirez, Leonardo, Fraunhofer FIT, DE Rashid, Umer, University College Dublin, IE Richter, Michael, -, DE Riedel, Till, TU Karlsruhe, DE *Rohde, Markus, University of Siegen, DE *Rohs, Michael, Deutsche Telekom Laboratories, TU Berlin DE Roto, Virpi, Nokia Research Center, FI Rouillard, Jose, LIFL, FR *Rukzio, Enrico, Lancaster University, UK Santoro, Carmen, ISTI/CNR, IT Saravanan, Vijayalakshmi, VIT University IN Satchell, Christine, Queensland University of Technology and University of Melbourne, AU *Schmidt, Albrecht, University of Duisburg-Essen DE *Schmidt-Belz, Barbara, Fraunhofer FIT, DE Schwartz, Tobias, Fraunhofer FIT, DE Sears, Andrew, University of Maryland Baltimore County US Spahn, Michael, SAP-Research, DE Specht, Marcus, Open University of the Netherlands NL Spelmezan, Daniel, RWTH Aachen University DE Stahl, Christoph, Saarland University DE Steinmetz, Arnd, -, DE Sterr, Gunter, -, DE Stevens, Gunnar, Fraunhofer FIT, DE Streefkerk, Jan Willem, TNO Defence, Security and Safety, NL Streng, Sara, Universität München, DE Symonds, Judith, AUT University, NZ *Terrenghi, Lucia, Vodafone, DE Thapliyal, Mathura, HNB Garhwal University, Srinagar(garhwal), Uttarakhand, IN Tripathi, Sanjay, Tech Mahindra, IN Tscheligi, Manfred, University of Salzburg, AT Turowski, Klaus, University of Augsburg, DE Vaananen-Vainio-Mattila, Kaisa, Tampere University of Technology, Human-Centered Technology FI van den Broek, Egon L., University of Twente NL van Megen, Friedel, -, DE Vanderdonckt, Jean, Université catholique de Louvai BE Vatavu, Radu Daniel, University Stefan cel Mare of Suceava, RO Vaughn, Heather, Alcatel-Lucent, US Villalba Mora, Elena, Universidad Politecnica Madrid ES Villar, Nicolas, Microsoft Research, UK *Vitaletti, Andrea, Sapienza Universita di Roma, IT Wac, Katarzyna, University of Geneva CH Wagner, Ina, Technical University Vienna, AT Weinberg, Garrett, Mitsubishi Electric Research Labs US Weiß, Malte, -, DE Wettach, Reto, University of Applied Sciences Potsdam DE Wimmer, Raphael, University of Munich, DE Witt, Hendrik, University of Bremen, DE Wittenhagen, Moritz, RWTH Aachen University DE *Wulf, Volker, University of Siegen and Fraunhofer FIT DE Yan, Zheng, Nokia Research Center, FI *Yasar, Ansar-Ul-Haque, Katholieke Universiteit Leuven BE Yatani, Koji, University of Toronto, CA Yoon, Youngwoo, Electronics and Telecommunications Research Institute, KR Zhong, Lin, Rice University, US *Zimmermann, Andreas, Fraunhofer FIT, DE Zudilova-Seinstra, Elena, University of Amsterdam, NL
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